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Proceedings Paper

Method for estimating dynamic EM tracking accuracy of surgical navigation tools
Author(s): Christopher Nafis; Vern Jensen; Lee Beauregard; Peter Anderson
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Paper Abstract

Optical tracking systems have been used for several years in image guided medical procedures. Vendors often state static accuracies of a single retro-reflective sphere or LED. Expensive coordinate measurement machines (CMM) are used to validate the positional accuracy over the specified working volume. Users are interested in the dynamic accuracy of their tools. The configuration of individual sensors into a unique tool, the calibration of the tool tip, and the motion of the tool contribute additional errors. Electromagnetic (EM) tracking systems are considered an enabling technology for many image guided procedures because they are not limited by line-of-sight restrictions, take minimum space in the operating room, and the sensors can be very small. It is often difficult to quantify the accuracy of EM trackers because they can be affected by field distortion from certain metal objects. Many high-accuracy measurement devices can affect the EM measurements being validated. EM Tracker accuracy tends to vary over the working volume and orientation of the sensors. We present several simple methods for estimating the dynamic accuracy of EM tracked tools. We discuss the characteristics of the EM Tracker used in the GE Healthcare family of surgical navigation systems. Results for other tracking systems are included.

Paper Details

Date Published: 10 March 2006
PDF: 16 pages
Proc. SPIE 6141, Medical Imaging 2006: Visualization, Image-Guided Procedures, and Display, 61410K (10 March 2006); doi: 10.1117/12.653448
Show Author Affiliations
Christopher Nafis, GE Global Research (United States)
Vern Jensen, GE Healthcare (United States)
Lee Beauregard, GE Healthcare (United States)
Peter Anderson, GE Healthcare (United States)


Published in SPIE Proceedings Vol. 6141:
Medical Imaging 2006: Visualization, Image-Guided Procedures, and Display
Kevin R. Cleary; Robert L. Galloway, Jr., Editor(s)

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