Share Email Print
cover

Proceedings Paper

Quantitative evaluation of mercuric iodide thick film for x-ray imaging device
Author(s): Kyung-Jin Kim; Sang-Sik Kang; Ji-Koon Park; Sung-Ho Cho; Byung-Youl Cha; Jung-Wook Shin; Sang-Hee Nam; Jae-Hyung Kim
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, we investigated electrical characteristics of the X-ray detector of mercuric iodide (HgI2) film fabricated by PIB(Particle-In-Binder) Method with thicknesses ranging from approximately 200μm to 240μm. In the present study, using I-V measurements, their electrical properties such as leakage current, X-ray sensitivity, and signal-to-noise ratio (SNR),were investigated. The results of our study can be useful in the future design and optimization of direct active-matrix flat-panel detectors (AMFPD) for various digital X-ray imaging modalities.

Paper Details

Date Published: 2 March 2006
PDF: 7 pages
Proc. SPIE 6142, Medical Imaging 2006: Physics of Medical Imaging, 61422Z (2 March 2006); doi: 10.1117/12.653002
Show Author Affiliations
Kyung-Jin Kim, Inje Univ. (South Korea)
Sang-Sik Kang, Inje Univ. (South Korea)
Ji-Koon Park, Inje Univ. (South Korea)
Sung-Ho Cho, Inje Univ. (South Korea)
Byung-Youl Cha, Inje Univ. (South Korea)
Jung-Wook Shin, Inje Univ. (South Korea)
Sang-Hee Nam, Inje Univ. (South Korea)
Jae-Hyung Kim, Inje Univ. (South Korea)


Published in SPIE Proceedings Vol. 6142:
Medical Imaging 2006: Physics of Medical Imaging
Michael J. Flynn; Jiang Hsieh, Editor(s)

© SPIE. Terms of Use
Back to Top