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Proceedings Paper

Pseudo no reference image quality metric using perceptual data hiding
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Paper Abstract

Regarding the important constraints due to subjective quality assessment, objective image quality assessment has recently been extensively studied. Such metrics are usually of three kinds, they might be Full Reference (FR), Reduced Reference (RR) or No Reference (NR) metrics. We focus here on a new technique, which recently appeared in quality assessment context: data-hiding-based image quality metric. Regarding the amount of data to be transmitted for quality assessment purpose, watermarking based techniques are considered as pseudo noreference metric: A little overhead due to the embedded watermark is added to the image. Unlike most existing techniques, the proposed embedding method exploits an advanced perceptual model in order to optimize both the data embedding and extraction. A perceptually weighted watermark is embedded into the host image, and an evaluation of this watermark allows to assess the host image's quality. In such context, the watermark robustness is crucial; it must be suffciently robust to be detected after very strong distortions, but it must also be suffciently fragile to be degraded along with the host image. In other words, the watermark distortion must be proportional to the image's distortion. Our work is compared to existing standard RR and NR metrics in terms of both the correlation with subjective assessment and of data overhead induced by the mark.

Paper Details

Date Published: 3 February 2006
PDF: 12 pages
Proc. SPIE 6057, Human Vision and Electronic Imaging XI, 60570G (3 February 2006); doi: 10.1117/12.650780
Show Author Affiliations
Alexandre Ninassi, Ecole Polytechnique de l'Univ. de Nantes (France)
Patrick Le Callet, Ecole Polytechnique de l'Univ. de Nantes (France)
Florent Autrusseau, Ecole Polytechnique de l'Univ. de Nantes (France)


Published in SPIE Proceedings Vol. 6057:
Human Vision and Electronic Imaging XI
Bernice E. Rogowitz; Thrasyvoulos N. Pappas; Scott J. Daly, Editor(s)

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