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Proceedings Paper

Automatic mura detection system for liquid crystal display panels
Author(s): Li-Te Fang; Hsin-Chia Chen; I-Chieh Yin; Sheng-Jyh Wang; Chao-Hua Wen; Cheng-Hang Kuo
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Paper Abstract

In this paper, we propose an automatic inspection system, which can automatically detect four types of muras on an LCD panel: cluster mura, v-band mura, rubbing mura, and light leakage mura. To detect cluster muras, the Laplacian of Gaussian (LOG) filter is used. A multi-resolution approach is proposed to detect cluster muras of different scales. To speed up the processing speed, this multi-resolution approach is actually implemented in the frequency domain. To detect v-band muras, we check the variation tendency of the projected 1-D intensity profile. Then, v-band muras are detected by identifying these portions of the 1-D profile where a large deviation occurs. To detect rubbing muras, we designed a frequency mask to detect distinct components in the frequency domain. To detect light leak muras, we apply image mirroring over the boundary parts and adopt the same LOG filter that has been used in detecting cluster muras. All four types of mura detection are integrated together in an efficient way and simulation results demonstrate that this system is indeed very helpful in detecting mura defects.

Paper Details

Date Published: 9 February 2006
PDF: 10 pages
Proc. SPIE 6070, Machine Vision Applications in Industrial Inspection XIV, 60700G (9 February 2006); doi: 10.1117/12.650686
Show Author Affiliations
Li-Te Fang, National Chiao Tung Univ. (Taiwan)
Hsin-Chia Chen, National Chiao Tung Univ. (Taiwan)
I-Chieh Yin, National Chiao Tung Univ. (Taiwan)
Sheng-Jyh Wang, National Chiao Tung Univ. (Taiwan)
Chao-Hua Wen, Taiwan TFT-LCD Association (Taiwan)
Cheng-Hang Kuo, Industrial Technology Research Institute (Taiwan)


Published in SPIE Proceedings Vol. 6070:
Machine Vision Applications in Industrial Inspection XIV
Fabrice Meriaudeau; Kurt S. Niel, Editor(s)

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