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Proceedings Paper

Microscopic measurement system for birefringence and optical rotation distribution
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Paper Abstract

A polarization measurement is proposed to detect a birefringence and an optical rotation distribution in a microscopic area. A residual stress caused by industrial processes and molecular orientation are observed by visualizing birefringence distribution. It is possible to analyze components of material with optical rotation. This measurement system consists of a He-Ne laser, polarizers, a half-wave and a quarter-wave plate. By changing combination of rotating angle of half-wave plate, quarter-wave plate and analyzer, we can obtain retardation, azimuthal angle of birefringence and optical rotation angle independently. An analytical algorithm with local-sampling phase shifting is employed for achieving a high resolution. The errors caused by the initial polarized characteristic of the optical system are corrected by subtracting the in-phase vector.

Paper Details

Date Published: 5 December 2005
PDF: 6 pages
Proc. SPIE 6048, Optomechatronic Actuators and Manipulation, 604807 (5 December 2005); doi: 10.1117/12.650553
Show Author Affiliations
Mizue Ebisawa, Tokyo Univ. of Agriculture and Technology (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)

Published in SPIE Proceedings Vol. 6048:
Optomechatronic Actuators and Manipulation
Kee S. Moon, Editor(s)

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