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Proceedings Paper

Jitter measurement method for the PRML signal processing
Author(s): Kazuya Katano; Mamoru Shoji; Keiji Kuono; Katsuya Watanabe
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Paper Abstract

The Blu-ray Disc (BD), which achieves approximately five times the recording density as that of a DVD, employs 1-7PP encoding, a more efficient encoding method than EFM+ modulation (8-16) of DVD. The shortest mark length recorded by this method is 2T (approximately one-third of the length) as compared to 3T of a DVD (where T is the channel clock period). Because it is difficult to reproduce such high-density signal using binarized decoding, Partial Response Maximum Likelihood (PRML) is often used in its place. Jitter, which has been used as a reference in the evaluation of the reproducing signal of DVDs, does not necessarily match the bit error that results from PRML decoding. Consequently, BD which heavily uses PRML decoding requires a new evaluation method that replaces the conventional method using jitter evaluation. Because the correlation between the jitter and bit error is worse when the jitter of the 2T mark is predominant among all mark jitters, we focused our attention to jitters that exclude the jitter of the 2T mark as a reference for evaluating the S/N ratio of the system directly through the use of the inter-symbol interference analysis function of the time interval analyzer. This paper describes the analysis of the correlation between jitters that exclude the jitter of the 2T mark and the bit error rate.

Paper Details

Date Published: 15 September 2005
PDF: 5 pages
Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 596621 (15 September 2005); doi: 10.1117/12.649817
Show Author Affiliations
Kazuya Katano, Yokogawa Electric Corp. (Japan)
Mamoru Shoji, Matsushita Electric Industrial Co., Ltd. (Japan)
Keiji Kuono, Yokogawa Electric Corp. (Japan)
Katsuya Watanabe, Matsushita Electric Industrial Co., Ltd. (Japan)

Published in SPIE Proceedings Vol. 5966:
Seventh International Symposium on Optical Storage (ISOS 2005)
Fuxi Gan; Lisong Hou, Editor(s)

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