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Proceedings Paper

Gaussian diffraction model for Sb thin films in super-resolution near-field structure
Author(s): Qingling Qu; Yang Wang; Liyong Ren; Jingsong Wei; Fuxi Gan
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Paper Abstract

According to the change of refractive index of Sb thin film with temperature and the radial distribution of temperature within the spot, we can consider the spot irradiated by a Gaussian beam as a phase-modulated screen. Based on Fresnel-kirchhoff diffraction theory, a Gaussian diffraction model which can compute the intensity from far field has been set up. Using this model we can study the nonlinear change of mask layer samples induced by different reasons. A numerical calculation of the transmittance through an Sb-type super-resolution near-field structure was carried out as an example. The Gaussian diffraction model, which is similar to the far field detection process in the optical disk system, is very useful for analyzing the photothermal-induced local structure change of thin films in phase-change and super-resolution optical disks.

Paper Details

Date Published: 15 September 2005
PDF: 5 pages
Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 59661A (15 September 2005); doi: 10.1117/12.649659
Show Author Affiliations
Qingling Qu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science (China)
Yang Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science (China)
Liyong Ren, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Science (China)
Jingsong Wei, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science (China)


Published in SPIE Proceedings Vol. 5966:
Seventh International Symposium on Optical Storage (ISOS 2005)
Fuxi Gan; Lisong Hou, Editor(s)

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