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Proceedings Paper

Static recording characteristics of super-resolution near-field structure with bismuth mask layer
Author(s): Feng Zhang; Yang Wang; Wendong Xu; Xiumin Gao; Fuxi Gan
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Paper Abstract

Static recording characteristics of super-resolution near-field structure with bismuth (Bi) mask layer and antimony (Sb) mask layer were investigated and compared. The experimental results show that Bi mask layer can also concentrate energy into the center of a laser beam at a low laser energy input similar to Sb, which may be because that Bi film exhibits giant nonlinearity at low laser intensity. The direct observation of laser-recording marks may help better understand the working mechanism of the super-RENS, super-resolution ablation, and other nonlinear switching phenomena.

Paper Details

Date Published: 15 September 2005
PDF: 4 pages
Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 596619 (15 September 2005); doi: 10.1117/12.649658
Show Author Affiliations
Feng Zhang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Yang Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Wendong Xu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Xiumin Gao, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
Fuxi Gan, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 5966:
Seventh International Symposium on Optical Storage (ISOS 2005)
Fuxi Gan; Lisong Hou, Editor(s)

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