Share Email Print
cover

Proceedings Paper

Real-time non-destructive testing of dynamic holograms in doubly doped LiNbO3 crystals using phase-conjugate technique
Author(s): Liyong Ren; Baoli Yao; Lili Wang; Yongfa Kong; Neimule MenKe; Zhiwei Ren; Ming Lei
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

To test the dynamic photorefractive grating during holographic recording, as usual, the signal wave is blocked from time to time and simultaneously the diffracted beam of the reference wave is tested. This kind of measurement destroys the continuity of the holographic recording and increases the random noise and results in bad repeatability and reliability. In this paper, the phase-conjugate technique is used to overcome the above drawbacks. The reference wave and the object wave are much stronger than the probe beam propagating along the counter-direction of the reference wave. Thus the real-time and non-destructive testing of the dynamic holograms can be obtained by measuring the phase-conjugate wave of the object wave.

Paper Details

Date Published: 15 September 2005
PDF: 4 pages
Proc. SPIE 5966, Seventh International Symposium on Optical Storage (ISOS 2005), 59660V (15 September 2005); doi: 10.1117/12.649637
Show Author Affiliations
Liyong Ren, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China)
Baoli Yao, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China)
Lili Wang, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China)
Yongfa Kong, Nankai Univ. (China)
Neimule MenKe, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China)
Zhiwei Ren, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China)
Ming Lei, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China)


Published in SPIE Proceedings Vol. 5966:
Seventh International Symposium on Optical Storage (ISOS 2005)
Fuxi Gan; Lisong Hou, Editor(s)

© SPIE. Terms of Use
Back to Top