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Proceedings Paper

High sensitivity measurements of the scattering dispersion of phantoms using spectral domain optical coherence tomography
Author(s): Shellee D. Dyer; Tasshi Dennis; Paul A. Williams; Lara K. Street; Shelley M. Etzel; R. Joseph Espejo; Thomas A. Germer; Thomas E. Milner
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Paper Abstract

We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence tomography measurements of the dispersion that is induced by the scattering process. We use both Mie scattering theory and dispersion measurements of phantoms to show that the scattering dispersion is very sensitive to small changes in the size and/or refractive index of the scatterer.

Paper Details

Date Published: 20 February 2006
PDF: 5 pages
Proc. SPIE 6079, Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X, 60791Q (20 February 2006); doi: 10.1117/12.649180
Show Author Affiliations
Shellee D. Dyer, National Institute of Standards and Technology (United States)
Tasshi Dennis, National Institute of Standards and Technology (United States)
Paul A. Williams, National Institute of Standards and Technology (United States)
Lara K. Street, National Institute of Standards and Technology (United States)
Shelley M. Etzel, National Institute of Standards and Technology (United States)
R. Joseph Espejo, National Institute of Standards and Technology (United States)
Thomas A. Germer, National Institute of Standards and Technology (United States)
Thomas E. Milner, Univ. of Texas at Austin (United States)


Published in SPIE Proceedings Vol. 6079:
Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X
Valery V. Tuchin; Joseph A. Izatt; James G. Fujimoto, Editor(s)

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