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Proceedings Paper

Non-contact measuring system in sinusoidal phase modulating interferometry using a laser diode
Author(s): Ki-Young Pyo; Geun-Young Lee; Weon-Jae Ryu; Young-June Kang; Nak-Kyu Park
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Paper Abstract

Recently, laser interferometry is widely used as a measuring system in many fields because of its high resolution and its ability to measure a broad area in real-time all at once. In conventional laser interferometry, for example Out-of-plane ESPI (Electronic Speckle Pattern Interferometry), In plane ESPI, Shearography and Holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include nonlinear errors and limited time of use. In the present study, a new type of laser interferometry using a laser diode is proposed. Using Laser Diode Sinusoidal Phase Modulating (LD-SPM) interferometry, the phase modulation can be directly modulated by controlling the laser diode injection current thereby eliminating the need for PZT and its components. This makes the interferometry more compact.

Paper Details

Date Published: 6 December 2005
PDF: 8 pages
Proc. SPIE 6051, Optomechatronic Machine Vision, 60510H (6 December 2005); doi: 10.1117/12.649086
Show Author Affiliations
Ki-Young Pyo, Chonbuk Univ. (South Korea)
Geun-Young Lee, Chonbuk Univ. (South Korea)
Weon-Jae Ryu, Jeonju Machinery Research Ctr. (South Korea)
Young-June Kang, Chonbuk Univ. (South Korea)
Nak-Kyu Park, Chonbuk Univ. (South Korea)


Published in SPIE Proceedings Vol. 6051:
Optomechatronic Machine Vision
Kazuhiko Sumi, Editor(s)

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