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Proceedings Paper

SIBS: a powerful concept for automatic segmentation of electron tomograms
Author(s): Alexandros A. Linaroudis; Reiner Hegerl
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Paper Abstract

A scaling index based segmentation (SIBS) method is proposed in order to improve visualization and interpretation of data obtained by electron tomography. Based on the interpretation of the scaling index as a measure for dimensionality, the pixels/voxels of an image/volume are subdivided into different categories according to the kind of structure they belong to. Using the weighted scaling index method proposed by Räth1 in conjunction with morphological operators, the approach was adapted to the field of electron microscopy, especially to three-dimensional application as needed by electron tomography. The method turns out to be quite effective for linear structures and membranes. Theory, implementation, parameter settings and results obtained with different kinds of data are presented and discussed.

Paper Details

Date Published: 15 March 2006
PDF: 7 pages
Proc. SPIE 6144, Medical Imaging 2006: Image Processing, 61443H (15 March 2006); doi: 10.1117/12.648883
Show Author Affiliations
Alexandros A. Linaroudis, Max-Planck-Institut für Biochemie (Germany)
Reiner Hegerl, Max-Planck-Institut für Biochemie (Germany)


Published in SPIE Proceedings Vol. 6144:
Medical Imaging 2006: Image Processing
Joseph M. Reinhardt; Josien P. W. Pluim, Editor(s)

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