Share Email Print

Proceedings Paper

Variable phase-contrast spectrometry for reconstructing the 3-dimensional distribution of components in single living cells
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We propose the spectroscopy-tomography of single cells to improve the early detection and treatment of cancer. This technology can obtain the 3-dimensional distribution of components at a high spatial resolution. In this paper, we mention the analysis result of the cross-sectional images of the microsphere whose diameter is 10 μm. The distribution of the internal submicron-defect in the microsphere can be analyzed. To obtain the correct 3-dimensional absorption distribution, the axial runout can not be allowed. However, the center of rotation is displaced because the cells have complex refractive index distribution. Therefore we propose the image processing that uses the normalized correlation function as estimated value. The cross-sectional image of the microsphere is improved and the vague internal defect becomes to be distinguished by this proposed method. Moreover, based on this method, the 3-dimentional refractive index distribution in a single cell is estimated and the part which has a high refractive index in the cell is distinguished clearly. And we mention the proposed variable phase-contrast spectrometry as the 2-dimensional high spatial resolution spectrometry. This proposed method is a phase-shift interferometry between the 0th order diffracted light and the higher order diffracted light. We discuss the experimental results of the spectral characteristics using the proposed variable phase-contrast spectrometry. We measured the spectral characteristics at each pixel using the color filter of the liquid crystal and verified that the 2-dimensional spectral characteristics can be measured with good result.

Paper Details

Date Published: 6 December 2005
PDF: 9 pages
Proc. SPIE 6049, Optomechatronic Sensors and Instrumentation, 60490A (6 December 2005); doi: 10.1117/12.648324
Show Author Affiliations
Y. Inoue, Kagawa Univ. (Japan)
I. Ishimaru, Kagawa Univ. (Japan)
T. Yasokawa, Kagawa Univ. (Japan)
K. Ishizaki, Kagawa Univ. (Japan)
M. Yoshida, Kagawa Univ. (Japan)

Published in SPIE Proceedings Vol. 6049:
Optomechatronic Sensors and Instrumentation
Yasuhiro Takaya, Editor(s)

© SPIE. Terms of Use
Back to Top