Share Email Print
cover

Proceedings Paper

Investigation of 3D microscopy using intensity diffraction tomography
Author(s): Mark A. Anastasio; Yin Huang; Greg Gbur; P. Scott Carney
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Diffraction tomography (DT) is an established imaging technique for reconstructing the complex-valued refractive index distribution of a weakly scattering 3D sample. Due to experimental difficulties associated with the direct measurement of the phase of an optical wavefield, the effectiveness of DT for optical imaging applications has been limited. A theory of intensity diffraction tomography (I-DT) has been proposed to circumvent this phase retrieval problem. In this work, we review the features of I-DT reconstruction theory that are relevant to optical microscopy. Computer-simulation studies are conducted to investigate the performance of reconstruction algorithms for a proposed I-DT microscope. The effects of data noise are assessed, and statistically optimal reconstruction strategies that employ multiple detector planes are proposed.

Paper Details

Date Published: 23 February 2006
PDF: 8 pages
Proc. SPIE 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII, 60900G (23 February 2006); doi: 10.1117/12.648169
Show Author Affiliations
Mark A. Anastasio, Illinois Institute of Technology (United States)
Yin Huang, Illinois Institute of Technology (United States)
Greg Gbur, Univ. of North Carolina at Charlotte (United States)
P. Scott Carney, Univ. of Illinois at Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 6090:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

© SPIE. Terms of Use
Back to Top