Share Email Print

Proceedings Paper

Optical extraction from Nd:YAG lasers with ASE gain depumping losses
Author(s): Drew A. Copeland
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical extraction characteristics of steady-state solid-state Nd:YAG lasers with amplified spontaneous emission (ASE) gain depumping losses are discussed. The gain model includes gain depumping losses by ASE and assumes that the medium is homogeneously-broadened. The rate equations describing the spatial growth of the intracavity intensities for a stable optical resonator are summarized, the threshold lasing condition is derived, and the coupled equations solved for the optical extraction efficiency using both first-order perturbation theory and a new numerical method in which the two-point boundary value problem is recast as an integral equation to be solved for the geometric mean of the forward and backward intensities at the optic axis. Solutions are determined for the optical extraction efficiency for medium parameters appropriate to high gain Nd:YAG lasers. Comparisons with the simple, uniform intracavity intensity model show the latter is not always a good approximation. The well-established empirical critera that the gain-length product satisfy gℓ < 2-4 to limit ASE power losses is shown to be a consequence of a constraint arising to ensure the validity of a perturbation solution of the stable resonator model and its upper limit is shown to be determined by the spectroscopic and lifetime parameters of the gain media.

Paper Details

Date Published: 28 February 2006
PDF: 15 pages
Proc. SPIE 6100, Solid State Lasers XV: Technology and Devices, 61001I (28 February 2006); doi: 10.1117/12.647517
Show Author Affiliations
Drew A. Copeland, The Boeing Co. (United States)

Published in SPIE Proceedings Vol. 6100:
Solid State Lasers XV: Technology and Devices
Hanna J. Hoffman; Ramesh K. Shori, Editor(s)

© SPIE. Terms of Use
Back to Top