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Proceedings Paper

Effects of a pupil filter on stimulated emission depletion microscopy
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Paper Abstract

Recently, stimulated emission depletion microscopy has achieved high resolution in fluorescent imaging. In this paper, we present effects of a pupil filter on the performances of stimulated emission depletion microscopy. In stimulated emission depletion microscopy, a saturated zero-centered spot is usually used to achieve a high lateral resolution. Using a half-coated phase plate, a zero-centered spot was made with a narrow and steep gap at the center. Numerical and experimental results show that by simply inserting a central obstacle as a pupil filter, it is possible to reduce the central gap of the zero-centered spot. However in order to compensate inevitable loss of light, which is blocked by the obstacle, increased laser power is required.

Paper Details

Date Published: 23 February 2006
PDF: 6 pages
Proc. SPIE 6090, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII, 60900X (23 February 2006); doi: 10.1117/12.647395
Show Author Affiliations
Hongki Yoo, Korea Advanced Institute of Science and Technology (South Korea)
Incheon Song, Korea Advanced Institute of Science and Technology (South Korea)
Taehoon Kim, Korea Advanced Institute of Science and Technology (South Korea)
Daegab Gweon, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 6090:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson, Editor(s)

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