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Proceedings Paper

Nonlinear lens mapping of optical substrates
Author(s): Sarik R. Nersisyan; Nelson V. Tabiryan; Leonid B. Glebov; Larissa N. Glebova
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Paper Abstract

We have tested a technique for characterizing optical substrates using high sensitivity of the constant of nonlinear refraction to the structural and compositional homogeneity of the material. The technique consists in two steps: first the substrate is positioned in the focal region of a lens where the signal of the nonlinear phase shift is maximal and, second, the substrate is scanned in directions transverse to the propagation direction of the probe laser beam. The measured variations are proportional to variations in the nonlinear phase shift across the substrate and reflect distribution of parameters that contribute into the nonlinear phase shift, including the absorption coefficient and substrate thickness. This technique can be used for mapping trace amounts of impurities, dopants and inclusions as well as varying external/boundary conditions in glass substrates, liquid crystals, and other materials. As an example, we have visualized subtle changes inflicted on a holographic glass by UV exposure.

Paper Details

Date Published: 23 February 2006
PDF: 7 pages
Proc. SPIE 6101, Laser Beam Control and Applications, 61011I (23 February 2006); doi: 10.1117/12.646567
Show Author Affiliations
Sarik R. Nersisyan, Beam Engineering for Advanced Measurements Co. (United States)
Nelson V. Tabiryan, Beam Engineering for Advanced Measurements Co. (United States)
Leonid B. Glebov, Univ. of Central Florida/CREOL (United States)
Larissa N. Glebova, Univ. of Central Florida/CREOL (United States)


Published in SPIE Proceedings Vol. 6101:
Laser Beam Control and Applications
Steven J. Davis; Michael C. Heaven; J. Thomas Schriempf; Alexis V. Kudryashov; Alan H. Paxton; Vladimir S. Ilchenko; Adolf Giesen; Detlef Nickel, Editor(s)

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