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Proceedings Paper

Ultrahigh resolution photonic crystal nanoprobe for high-density optical data storage, near-field microscopy, and nanolithography systems
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Paper Abstract

In this paper we present the implementation, optimization and commercialization of an ultra-high resolution nano-probe in near field scanning optical microscopy/ spectroscopy (SNOM), nanolithography and high density optical data storage. The theme underlying this effort is the ability to examine or be able to write and/or read ultra fine feature sizes using near field based nano probes. The reason for pursing such research lies in the opportunities it offers for extending the applications of conventional optical microscopy into the nano meter scale domain. Furthermore near-field optical imaging preserves the inherent polarizing, non-invasive, spectroscopic and high temporal resolving capabilities of conventional microscopy, which are absent from other high-resolution techniques

Paper Details

Date Published: 1 March 2006
PDF: 12 pages
Proc. SPIE 6128, Photonic Crystal Materials and Devices IV, 61281R (1 March 2006); doi: 10.1117/12.646070
Show Author Affiliations
Ahmed Sharkawy, EM Photonics Inc. (United States)
Greg Bermnhan, EM Photonics Inc. (United States)
Shouyuan Shi, Univ. of Delaware (United States)
Thomas Dillion, Univ. of Delaware (United States)
Dennis W. Prather, Univ. of Delaware (United States)

Published in SPIE Proceedings Vol. 6128:
Photonic Crystal Materials and Devices IV
Ali Adibi; Shawn-Yu Lin; Axel Scherer, Editor(s)

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