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Proceedings Paper

Fast amplitude and delay measurement for characterization of integrated optic devices
Author(s): M. Thompson; H. Zhu; W. Rivera; M. Solmaz; D. Adams; C. K. Madsen
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Paper Abstract

A fast, non-interferometric measurement technique that allows the frequency-dependent delay and amplitude responses to be measured is presented. For a single amplitude and relative phase measurement at a fixed optical wavelength, the measurement time is on the order of a microsecond. RF modulation up to 2.7 GHz can be accommodated. A modified technique using frequency modulation is described to overcome non-idealities in the phase measurement. Results are presented for a fiber Bragg grating and an acetylene gas cell with swept-wavelength laser tuning at a rate of 40 nm/s.

Paper Details

Date Published: 24 February 2006
PDF: 9 pages
Proc. SPIE 6123, Integrated Optics: Devices, Materials, and Technologies X, 612304 (24 February 2006); doi: 10.1117/12.645911
Show Author Affiliations
M. Thompson, Texas A&M Univ. (United States)
H. Zhu, Texas A&M Univ. (United States)
W. Rivera, Texas A&M Univ. (United States)
M. Solmaz, Texas A&M Univ. (United States)
D. Adams, Texas A&M Univ. (United States)
C. K. Madsen, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 6123:
Integrated Optics: Devices, Materials, and Technologies X
Yakov Sidorin; Christoph A. Waechter, Editor(s)

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