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Proceedings Paper

Refractive index and geometrical structure measurement of a core-doped photonic crystal fiber
Author(s): Y. Youk; S. Kim; K. Oh; J. Kobelke; K. Schuster; J. Kirchhof; D. Y. Kim
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Paper Abstract

Using confocal scanning optical microscopy, we carried out a direct refractive index profiling technique of complex and non-symmetric structured optical fibers. Several improvements on the earlier design are proposed; a light emitting diode (LED) at 658 nm wavelength instead of a laser diode (LD) or He-Ne laser is used as a light source for better index precision, and a simple longitudinal linear scanning and a curve fitting techniques are adapted instead of a servo control for maintaining an optical confocal arrangement. Also, we have developed a novel technique to remove measurement noise generated by pinhole diffraction. This improved, straightforward, and robust method can be used to determine the refractive index profile of optical fibers by determining the reflectivity of a sample's surface. This technique is easy and repeatable, and we demonstrated the refractive index measurement of a core-doped photonic crystal fiber for the first time.

Paper Details

Date Published: 1 March 2006
PDF: 8 pages
Proc. SPIE 6128, Photonic Crystal Materials and Devices IV, 61281P (1 March 2006); doi: 10.1117/12.645723
Show Author Affiliations
Y. Youk, Gwangju Institute of Science and Technology (South Korea)
S. Kim, Gwangju Institute of Science and Technology (South Korea)
K. Oh, Gwangju Institute of Science and Technology (South Korea)
J. Kobelke, Institut für Physikalische Hochtechnologi (Germany)
K. Schuster, Institut für Physikalische Hochtechnologi (Germany)
J. Kirchhof, Institut für Physikalische Hochtechnologi (Germany)
D. Y. Kim, Gwangju Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 6128:
Photonic Crystal Materials and Devices IV
Ali Adibi; Shawn-Yu Lin; Axel Scherer, Editor(s)

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