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Proceedings Paper

A new method for simultaneous measurement of phase retardation and optical axis of a compensation film
Author(s): Yung-Hsun Wu; Ju-Hyun Lee; Yi-Hsin Lin; Hongwen Ren; Shin-Tson Wu
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Paper Abstract

We demonstrate a new method for simultaneously measuring the phase retardation and optic axis of a compensation film by using an axially-symmetric sheared polymer network liquid crystal (AS-SPNLC). The AS-SPNLC is a liquid crystal structure with radial director distribution and its phase retardation has a gradient change from center to edges. When overlaying a tested compensation film with a calibrated AS-SPNLC cell between crossed polarizers, the optic axis and phase retardation value of the compensation film can be determined. This method is particularly useful for those optical systems whose optic axis and phase retardation are dynamically changing.

Paper Details

Date Published: 23 February 2006
PDF: 10 pages
Proc. SPIE 6135, Liquid Crystal Materials, Devices, and Applications XI, 613506 (23 February 2006); doi: 10.1117/12.645156
Show Author Affiliations
Yung-Hsun Wu, College of Optics and Photonics, Univ. of Central Florida (United States)
Ju-Hyun Lee, College of Optics and Photonics, Univ. of Central Florida (United States)
Yi-Hsin Lin, College of Optics and Photonics, Univ. of Central Florida (United States)
Hongwen Ren, College of Optics and Photonics, Univ. of Central Florida (United States)
Shin-Tson Wu, College of Optics and Photonics, Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 6135:
Liquid Crystal Materials, Devices, and Applications XI
Liang-Chy Chien, Editor(s)

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