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Proceedings Paper

Combined TIRF-AFM setup: controlled quenching of individual quantum dots
Author(s): Rainer Eckel; Volker Walhorn; Christoph Pelargus; Jörg Martini; Thomas Nann; Dario Anselmetti; Robert Ros
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Paper Abstract

Single molecules can nowadays be investigated by means of optical, mechanical and electrical methods. Fluorescence imaging and spectroscopy yield valuable and quantitative information about the optical properties and the spatial distribution of single molecules. Force spectroscopy by atomic force microscopy (AFM) or optical tweezers allows addressing, manipulation and quantitative probing of the nanomechanical properties of individual macromolecules. We present a combined AFM and total internal reflection fluorescence (TIRF) microscopy setup that enables ultrasensitive laser induced fluorescence detection of individual fluorophores, control of the AFM probe position in x, y and z-direction with nanometer precision, and simultaneous investigation of optical and mechanical properties at the single molecule level. Here, we present the distance-controlled quenching of semiconductor quantum dot clusters with an AFM tip. In future applications, fluorescence resonant energy transfer between single donor and acceptor molecules will be investigated.

Paper Details

Date Published: 27 February 2006
PDF: 8 pages
Proc. SPIE 6092, Ultrasensitive and Single-Molecule Detection Technologies, 609209 (27 February 2006); doi: 10.1117/12.645067
Show Author Affiliations
Rainer Eckel, Bielefeld Univ. (Germany)
Volker Walhorn, Bielefeld Univ. (Germany)
Christoph Pelargus, Bielefeld Univ. (Germany)
Jörg Martini, Bielefeld Univ. (Germany)
Thomas Nann, Univ. of Freiburg (Germany)
Dario Anselmetti, Bielefeld Univ. (Germany)
Robert Ros, Bielefeld Univ. (Germany)


Published in SPIE Proceedings Vol. 6092:
Ultrasensitive and Single-Molecule Detection Technologies
Jörg Enderlein; Zygmunt K. Gryczynski, Editor(s)

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