Share Email Print
cover

Proceedings Paper

Edge termination effects on finite aperture polarizers for polarimetric imaging applications at mid-wave IR
Author(s): A. A. Cruz-Cabrera; S. A. Kemme; J. R. Wendt; R. R. Boye; T. R. Carter; S. Samora
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Polarimetric imaging applications at the 2 to 5 μm or Mid-Wave Infrared (MWIR) range use large pixel-count focal plane arrays (FPA) with small pixel size. This project is centered in designing, fabricating and testing micropolarizers that work in that wavelength regime and intended for that type of FPAs. The micro-polarizers will be used in conjunction with a FPA in snapshot mode and will be in the near field of the imaging device. The pixel pitches for some commercial FPAs are small enough that the finite apertures of the polarizing devices may significantly affect their performance given that their aperture size varies between 3 and 5 waves. We are interested in understanding the effect on extinction ratio due to variations in the edge terminations of a polarizer with a small aperture. Edge terminations are the spaces between the first or last wire with the perimeter of the aperture of the polarizer. While this parameter has negligible effects on a larger polarizer, it will be significant for apertures that are about 3 to 5 waves. We will present data that indicates significant variation in performance due to edge terminations.

Paper Details

Date Published: 28 February 2006
PDF: 10 pages
Proc. SPIE 6126, Photonics Packaging and Integration VI, 61260K (28 February 2006); doi: 10.1117/12.644310
Show Author Affiliations
A. A. Cruz-Cabrera, Sandia National Labs. (United States)
S. A. Kemme, Sandia National Labs. (United States)
J. R. Wendt, Sandia National Labs. (United States)
R. R. Boye, Sandia National Labs. (United States)
T. R. Carter, L&M Technologies (United States)
S. Samora, L&M Technologies (United States)


Published in SPIE Proceedings Vol. 6126:
Photonics Packaging and Integration VI
Allen M. Earman; Ray T. Chen, Editor(s)

© SPIE. Terms of Use
Back to Top