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Proceedings Paper

Sub-resolution axial localization of nanoparticles in fluorescence microscopy
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Paper Abstract

We propose a method for sub-resolution axial localization of particles in fluorescence microscopy, based on maximum-likelihood estimation. Given acquisitions of a defocused fluorescent particle, we can estimate its axial position with nanometer range precision.

Paper Details

Date Published: 8 October 2005
PDF: 4 pages
Proc. SPIE 5860, Confocal, Multiphoton, and Nonlinear Microscopic Imaging II, 58600P (8 October 2005); doi: 10.1117/12.643899
Show Author Affiliations
Francois Aguet, Ecole Polytechnique Federale de Lausanne (Switzerland)
Dimitri Van De Ville, Ecole Polytechnique Federale de Lausanne (Switzerland)
Michael Unser, Ecole Polytechnique Federale de Lausanne (Switzerland)


Published in SPIE Proceedings Vol. 5860:
Confocal, Multiphoton, and Nonlinear Microscopic Imaging II
Tony Wilson, Editor(s)

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