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Proceedings Paper

Discrete circles measurement for industrial inspection
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Paper Abstract

This article deals with the problem of the determination of characteristics of imperfect circular objects on discrete images mainly the radius and center's coordinates. Imperfections are provided by discretization, noise and interior distortions present in some production processes. To this end, a multi-level method based on active contours was developed and tested on, noisy or not, misshaped or not, simulated circles whom centers and radius were known. The adequacy of this approach was tested with several methods, among them several Radon based ones. More particularly, this study indicates the relevance of the use of active contours combined with a Radon transform based method, using a description of circles from their tangents, improved thanks to a fitting considering the discrete implementation of Radon transform. Through this study, an active region algorithm based on stationary states of a non linear diffusion principle is proposed. Its originality is to obtain a set of geometric envelopes in one pass, with a correspondence between level threshold of the grayscale result and a regularity scale, more or less close to the original shape. This set of geometric envelopes gives a multiscale representation, from a very regular approximation to a full detailed and roughest representation. Then, a more robust measure of the circle parameters can be computed.

Paper Details

Date Published: 9 February 2006
PDF: 12 pages
Proc. SPIE 6070, Machine Vision Applications in Industrial Inspection XIV, 60700K (9 February 2006); doi: 10.1117/12.642326
Show Author Affiliations
Fabrice Mairesse, Univ. de Bourgogne, Le2i, UMR, CNRS 5158 (France)
Tadeusz Sliwa, Univ. de Bourgogne, Le2i, UMR, CNRS 5158 (France)
Stéphane Binczak, Univ. de Bourgogne, Le2i, UMR, CNRS 5158 (France)
Yvon Voisin, Univ. de Bourgogne, Le2i, UMR, CNRS 5158 (France)


Published in SPIE Proceedings Vol. 6070:
Machine Vision Applications in Industrial Inspection XIV
Fabrice Meriaudeau; Kurt S. Niel, Editor(s)

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