Share Email Print
cover

Proceedings Paper

Thermal effects in three-dimensional recording by femto/nano-second pulses
Author(s): Saulius Juodkazis; Mingwei Li; Dmitry Kotin; Igor Maksimov; Egidijus Vanagas; Hiroaki Misawa
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Thermal effects are unavoidable in laser material processing and are present, to some extent, even in the case when ultra-short (sub-picosecond) pulsed irradiation is used. We discuss here the matters of high-precision energy delivery into micrometer-sized volumes for three-dimensional (3D) laser microfabrication. Precise account of the absorbed energy, pulse duration, and focal spot size allows to optimize laser processing parameters. As an example, a 3D micro-structuring of silica with better than 15 μm resolution is demonstrated by pulses of 11 ns duration and 266 nm wavelength (for a focusing by a low numerical aperture NA = 0.029 lens). The two photon absorption coefficient of silica, β ≃ 60 ± 10 cm/GW, at 266 nm has been determined. The thermal black-body type emission of non-equilibrated electrons is discussed as a possible light source for 3D modification and structuring of photo-sensitive and photo-polymerizable materials. It is also demonstrated that optical properties of ionized dielectrics can be used to determine the temperature.

Paper Details

Date Published: 15 February 2006
PDF: 12 pages
Proc. SPIE 6118, Ultrafast Phenomena in Semiconductors and Nanostructure Materials X, 611807 (15 February 2006); doi: 10.1117/12.641130
Show Author Affiliations
Saulius Juodkazis, CREST-JST, Hokkaido Univ. (Japan)
Laser Systems Inc. (Japan)
Mingwei Li, Spectra-Physics (United States)
Dmitry Kotin, Nizhny Novgorod Univ. (Russia)
Igor Maksimov, Nizhny Novgorod Univ. (Russia)
Egidijus Vanagas, Laser Systems Inc. (Japan)
Hiroaki Misawa, CREST-JST, Hokkaido Univ. (Japan)
Laser Systems, Inc. (Japan)


Published in SPIE Proceedings Vol. 6118:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials X
Kong-Thon Tsen; Jin-Joo Song; Hongxing Jiang, Editor(s)

© SPIE. Terms of Use
Back to Top