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Proceedings Paper

Detection of high frequency acoustic transients using coherent EUV light
Author(s): Ra'anan Tobey; Mark Siemens; Margaret Murnane; Henry Kapteyn; Keith Nelson
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Paper Abstract

Ultrafast Extreme Ultraviolet (EUV) radiation is used to probe transient surface phenomenon in three experimental geometries. Optical irradiation of the sample surface generates thermal and acoustic transients that are subsequently probed with a time-delayed EUV pulse. In all experimental geometries we show excellent signal-to-noise ratios (>10:1) and increased sensitivity to surface deformations (<.02nm) directly attributable to the reduced wavelength of the probing light.

Paper Details

Date Published: 15 February 2006
PDF: 9 pages
Proc. SPIE 6118, Ultrafast Phenomena in Semiconductors and Nanostructure Materials X, 611806 (15 February 2006); doi: 10.1117/12.640844
Show Author Affiliations
Ra'anan Tobey, Univ. of Colorado, Boulder (United States)
Mark Siemens, Univ. of Colorado, Boulder (United States)
Margaret Murnane, Univ. of Colorado, Boulder (United States)
Henry Kapteyn, Univ. of Colorado, Boulder (United States)
Keith Nelson, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 6118:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials X
Kong-Thon Tsen; Jin-Joo Song; Hongxing Jiang, Editor(s)

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