Share Email Print

Proceedings Paper

Micro-Raman spectroscopy and E-SEM analysis of hybrid layer at the dentine/resin interface of three different composite restorative resins
Author(s): C. Camerlingo; G. M. Gaeta D.D.S.; R. Riccio D.D.S.; F. Rosso; L. Muscariello; M. Lepore
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The formation of a hybrid layer at the dentin/resin interface is a critical point in the curative processes. New restorative materials are currently under investigation in order to improve the characteristics of this interface layer. In this paper micro-Raman spectroscopy and Environmental Scanning Electron Microscope (E-SEM) analysis have been performed to investigate the interface properties of three different restorative materials. The experimental investigation has been performed on tooth cavities prepared both by Er:YAG laser ablation and by conventional diamond bur. Laser prepared cavities were realized using 100 ms pulsed light beam with energy of 350 mJ, at a frequency of 20 Hz. The cavities were filled with three different composites: True-Vitality (Den-Mat), Enamel Plus (Micerium), Supreme (3M). The treated samples were sectioned perpendicularly to the exposed dentin surface and the morphological characterization of the samples was performed by means of E-SEM operating in wet mode. This equipment permits to obtain a high-resolution image of surface without conductive coating process. The same samples were then examined by micro-Raman spectroscopy that has already shown its validity in the study of dentin/resin interfaces.

Paper Details

Date Published: 15 February 2006
PDF: 8 pages
Proc. SPIE 6137, Lasers in Dentistry XII, 61370I (15 February 2006); doi: 10.1117/12.640317
Show Author Affiliations
C. Camerlingo, Istituto di Cibernetica E. Caianiello, Consiglio Nazionale delle Ricerche (Italy)
G. M. Gaeta D.D.S., Seconda Univ. degli Studi di Napoli (Italy)
R. Riccio D.D.S., Seconda Univ. degli Studi di Napoli (Italy)
F. Rosso, Seconda Univ. degli Studi di Napoli (Italy)
L. Muscariello, Seconda Univ. degli Studi di Napoli (Italy)
M. Lepore, Seconda Univ. degli Studi di Napoli (Italy)

Published in SPIE Proceedings Vol. 6137:
Lasers in Dentistry XII
Peter Rechmann D.D.S.; Daniel Fried, Editor(s)

© SPIE. Terms of Use
Back to Top