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Proceedings Paper

The x pinch as an x-ray source for point-projection radiography
Author(s): S. A. Pikuz; T. A. Shelkovenko; A. R. Mingaleev; V. M. Romanova; B. M. Song; K. M. Chandler; M. D. Mitchell; D. A. Hammer
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Paper Abstract

Two methods of using the X pinch as a source of X-ray radiation for the radiography of dense plasmas and other objects are presented. These methods do not use pinholes, instead taking advantage of the small source size (<1 mm, and in some cases <1 pm) and short X-ray emission duration (< 2 ns , and < 20 ps in some cases) of the X pinch radiation. Detailed measurements of the emission characteristics of X pinches made using different wire materials and in different energy ranges using a set of X-ray diagnostics with high temporal and spatial resolution are presented. Several applications of the X pinch are discussed.

Paper Details

Date Published: 7 December 2006
PDF: 9 pages
Proc. SPIE 5974, International Conference on Charged and Neutral Particles Channeling Phenomena, 59740L (7 December 2006); doi: 10.1117/12.639993
Show Author Affiliations
S. A. Pikuz, Cornell Univ. (United States)
P.N. Lebedev Physical Institute (Russia)
T. A. Shelkovenko, Cornell Univ. (United States)
P.N. Lebedev Physical Institute (Russia)
A. R. Mingaleev, P.N. Lebedev Physical Institute (Russia)
V. M. Romanova, P.N. Lebedev Physical Institute (Russia)
B. M. Song, Cornell Univ. (United States)
K. M. Chandler, Cornell Univ. (United States)
M. D. Mitchell, Cornell Univ. (United States)
D. A. Hammer, Cornell Univ. (United States)


Published in SPIE Proceedings Vol. 5974:
International Conference on Charged and Neutral Particles Channeling Phenomena
Sultan B. Dabagov, Editor(s)

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