Share Email Print

Proceedings Paper

Modular streak camera concept with independent design of electro-optical configuration and electronics
Author(s): Patrick Summ; Bernd Reinke; Manuel Jung; Wilfried Uhring
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Streak cameras are typically designed by a top-down concept. Top of the concept is the streak tube technology that is selected to obtain best measurement results for the application specific requirements. As streak tubes vary in physical dimensions and electrical characteristics, streak cameras are designed with different mechanical housings, tube polarisation electronics, sweep units and communication interfaces. This approach leads to a large number of individual and consequently expensive streak cameras. A new streak camera concept allows the integration of different streak tubes to offer more flexibility for specific application requirements but also general needs. The mechanical design provides interfaces for various sweep units, image intensifier units or electro-mechanical shutter devices. The concept supports a modular configuration using plug-in sweep units today only realised with standard streak cameras. Combined with standardised electrical interfaces, the streak camera can be configured for various applications without redesign. This additionally allows the adaptation to vacuum and other demanding environmental conditions.

Paper Details

Date Published: 21 September 2005
PDF: 7 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 59200S (21 September 2005); doi: 10.1117/12.639832
Show Author Affiliations
Patrick Summ, Optronis GmbH (Germany)
Bernd Reinke, Optronis GmbH (Germany)
Manuel Jung, Optronis GmbH (Germany)
Wilfried Uhring, InESS (France)

Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Stuart Kleinfelder; Dennis L. Paisley; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

© SPIE. Terms of Use
Back to Top