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Proceedings Paper

On reliability of submicron and nanoelectronic devices
Author(s): Angelica Bacivarov
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Paper Abstract

Although higher reliability is expected from submicron and nanotechnology so far only a few attempts have been made to apply reliability theory to submicron and nanodevices. The way to reliable nanotechnology is to identify relevant physical failure mechanisms and corresponding failure rates, determine reliability indices, and investigate reliability models down to nanoscale including quantum processes. Perhaps the most significant problem concerns the sensitivity of future IC generations face to various noise sources, and in patxularly face to energetic particles. This paper analyses some of the above problems. At the same time, we propose the implementation of a new soft error detecting technique based on time redundancy.

Paper Details

Date Published: 14 December 2005
PDF: 6 pages
Proc. SPIE 5972, Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II, 597219 (14 December 2005); doi: 10.1117/12.639773
Show Author Affiliations
Angelica Bacivarov, Univ. Politehnica Bucharest (Romania)

Published in SPIE Proceedings Vol. 5972:
Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies II
Ovidiu Iancu; Adrian Manea; Paul Schiopu; Dan Cojoc, Editor(s)

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