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Proceedings Paper

Holographic recording of subwavelength structures in amorphous chalcogenide thin films
Author(s): Mara Reinfelde; Janis Teteris
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Paper Abstract

Holographic recording of surface-relief and refiactive-index-modulated gratings with a period ranging from 0.15 to 1 μm in thin amorphous chalcogenide films of As-S-Se and As2S3 is studied. The profile of the surface-relief gratings is measured by atomic force microscopy. By structuring the As-S-Se films with the subwavelength-period surface-relief gratings their reflectivity is decreased from 25-30% to less than 2%. In the refractive-index-modulated As2S3 films polarization effects are revealed. It is shown that the angular selectivity of the holographic recording in amorphous chalcogenide thin films can be substantially improved by decreasing the grating period.

Paper Details

Date Published: 13 June 2006
PDF: 8 pages
Proc. SPIE 5946, Optical Materials and Applications, 59461J (13 June 2006); doi: 10.1117/12.639331
Show Author Affiliations
Mara Reinfelde, Univ. of Latvia (Latvia)
Janis Teteris, Univ. of Latvia (Latvia)


Published in SPIE Proceedings Vol. 5946:
Optical Materials and Applications
Arnold Rosental, Editor(s)

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