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Proceedings Paper

Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films
Author(s): P. Adamson
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Paper Abstract

The reflection of s- or p-polarized electromagnetic plane waves from an N-layer system of inhomogeneous ultrathin dielectric films in the vicinity of the classical Brewster angle is investigated analytically in the long-wavelength limit. The second-order approximate formulas for principal and polarizing angles are derived and their accuracy is estimated by using exact numerical methods for calculating the reflection characteristics of inhomogeneous films. It is shown that expressions obtained for characteristic reflection angles are of immediate interest to the solution of the inverse problem for nanoscopic-layered structures. A few novel straightforward methods for optical diagnostics of ultrathin layers are established.

Paper Details

Date Published: 13 June 2006
PDF: 10 pages
Proc. SPIE 5946, Optical Materials and Applications, 594617 (13 June 2006); doi: 10.1117/12.639320
Show Author Affiliations
P. Adamson, Univ. of Tartu (Estonia)


Published in SPIE Proceedings Vol. 5946:
Optical Materials and Applications
Arnold Rosental, Editor(s)

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