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Proceedings Paper

New measurement tool to measure scattering of materials for 2D/3D scattered light measurements and BRDF/BTDF measurements
Author(s): Audrey Le Lay
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Paper Abstract

Why do we need to characterize surfaces and specially scattering of surfaces? In many industries including the automotive industry, interaction of light with materials is very important, in headlamps, tail lamps, dashboards, and the simulations made by designers, developers with their illumination design software, their realistic rendering software need scattering data to perform simulations and get results. Unfortunately, only theoretical data are available right now, and simulation results are not relevant of reality. It is why we have developed the REFLET Bench to answer all these problems.

Paper Details

Date Published: 20 October 2005
PDF: 8 pages
Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 596527 (20 October 2005); doi: 10.1117/12.639293
Show Author Affiliations
Audrey Le Lay, Light Tec (France)


Published in SPIE Proceedings Vol. 5965:
Optical Fabrication, Testing, and Metrology II
Angela Duparré; Roland Geyl; Lingli Wang, Editor(s)

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