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Proceedings Paper

Optical damage measurements for high peak power ytterbium doped fiber amplifiers
Author(s): S. Webster; F.C. McDonald; A. Villanger; M.J. Soileau; E.W. Van Stryland; D.J. Hagan; B. McIntosh; W. Torruellas; J. Farroni; K. Tankala
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Paper Abstract

N-on-1 LIDT measurements were performed on ytterbium doped preforms used to make high peak power fiber amplifiers. Damage measurements were complicated by large index of refraction changes across the preforms. These difficulties were overcome by monitoring the beam profile before and after the samples and by only taking data where the transmitted beam was not significantly distorted. Single and 1000 shot data suggest slight laser conditioning of the preforms and rule out laser fatigue in the doped cores and surrounding fused silica. At 1064 nm, inside the emission spectra, there seemed to be little influence of the Yb dopant concentration on the measured LIDT.

Paper Details

Date Published: 7 February 2006
PDF: 9 pages
Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599115 (7 February 2006); doi: 10.1117/12.639287
Show Author Affiliations
S. Webster, College of Optics and Photonics, Univ. of Central Florida (United States)
F.C. McDonald, College of Optics and Photonics, Univ. of Central Florida (United States)
A. Villanger, College of Optics and Photonics, Univ. of Central Florida (United States)
M.J. Soileau, College of Optics and Photonics, Univ. of Central Florida (United States)
E.W. Van Stryland, College of Optics and Photonics, Univ. of Central Florida (United States)
D.J. Hagan, College of Optics and Photonics, Univ. of Central Florida (United States)
B. McIntosh, Fibertek Inc. (United States)
W. Torruellas, Fibertek Inc. (United States)
J. Farroni, Nufern (United States)
K. Tankala, Nufern (United States)


Published in SPIE Proceedings Vol. 5991:
Laser-Induced Damage in Optical Materials: 2005
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz, Editor(s)

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