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Proceedings Paper

Active and passive millimeter- and sub-millimeter-wave imaging
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Paper Abstract

We have developed several millimeter/submillimeter/terahertz systems to study active and passive imaging and associated phenomenology. For measuring the transmission and scattering properties of materials, we have developed a dual rotary stage scattering system with active illumination and a Fourier Transform spectrometer. For imaging studies, we have developed a system based on a 12-inch diameter raster-scanned mirror. By interchange of active sources and both heterodyne and bolometric detectors, this system can be used in a variety of active and passive configurations. The laboratory measurements are used as inputs for, and model calibration and validation of, a terahertz imaging system performance model used to evaluate different imaging modalities for concealed weapon identification. In this paper, we will present examples of transmission and scattering measurements for common clothing as well as active imaging results that used a 640 GHz source and receiver.

Paper Details

Date Published: 7 November 2005
PDF: 8 pages
Proc. SPIE 5989, Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II, 598918 (7 November 2005); doi: 10.1117/12.638982
Show Author Affiliations
Douglas T. Petkie, Wright State Univ. (United States)
Frank C. De Lucia, Ohio State Univ. (United States)
Corey Castro, Ohio State Univ. (United States)
Paul Helminger, Univ. of South Alabama (United States)
Eddie L. Jacobs, U.S. Army Night Vision and Electronic Sensors Directorate (United States)
Steven K. Moyer, U.S. Army Night Vision and Electronic Sensors Directorate (United States)
Steve Murrill, Army Research Lab. (United States)
Carl Halford, Univ. of Memphis (United States)
Steve Griffin, Univ. of Memphis (United States)
Charmaine Franck, Science Applications International Corp. (United States)


Published in SPIE Proceedings Vol. 5989:
Technologies for Optical Countermeasures II; Femtosecond Phenomena II; and Passive Millimetre-Wave and Terahertz Imaging II
Sean M. Kirkpatrick; David H. Titterton; Roger Appleby; J. Martyn Chamberlain; Razvan Stoian; Keith A. Krapels, Editor(s)

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