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Proceedings Paper

Potentialities of optical profilometer MicroProf FRT for surface quality measurement
Author(s): Kateřina Páleníkova; Miloslav Ohlídal
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Paper Abstract

Principle, parameters and selected applications of the optical profilometer MicroProf FRT (Fries Research & Technology GmbH) in determining surface quality are presented in this contribution.

Paper Details

Date Published: 6 December 2006
PDF: 6 pages
Proc. SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 594510 (6 December 2006); doi: 10.1117/12.638927
Show Author Affiliations
Kateřina Páleníkova, Brno Univ. of Technology (Czech Republic)
Miloslav Ohlídal, Brno Univ. of Technology (Czech Republic)


Published in SPIE Proceedings Vol. 5945:
14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Anton Štrba; Dagmar Senderákova; Miroslav Hrabovský, Editor(s)

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