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Proceedings Paper

Digital two-wavelength holographic interference microscopy for surface roughness measurement
Author(s): Miloslav Ohlídal; Ludek Šír; Miloš Jákl; Ivan Ohlídal
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Paper Abstract

A new approach to surface roughness measurement based on the digital two-wavelength holographic interference microscopy with the synthetic wavelength is presented. Two holograms of a randomly rough surface are recorded step by step at two wavelengths by means of a CCD camera. Both holograms are numerically reconstructed. Two reconstructed waves obtained numerically interfere. The surface roughness parameters may be determined from the interferogram.

Paper Details

Date Published: 6 December 2006
PDF: 8 pages
Proc. SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 59450I (6 December 2006); doi: 10.1117/12.638915
Show Author Affiliations
Miloslav Ohlídal, Brno Univ. of Technology (Czech Republic)
Ludek Šír, Brno Univ. of Technology (Czech Republic)
Miloš Jákl, Brno Univ. of Technology (Czech Republic)
Ivan Ohlídal, Masaryk Univ. in Brno (Czech Republic)


Published in SPIE Proceedings Vol. 5945:
14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Anton Štrba; Dagmar Senderákova; Miroslav Hrabovský, Editor(s)

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