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Proceedings Paper

Measuring the effective thicknesses of optical elements knowing their dispersion and using white-light spectral interferometry
Author(s): Petr Hlubina; Igor Gurov; Vladimir Chugunov
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Paper Abstract

A phase-locked loop method is applied in processing the spectral interferograms resolved in a narrow spectral range in a dispersive Michelson interferometer including optical elements. The unwrapped spectral fringe phases with 2π ambiguity are determined and a simple procedure in removing the ambiguity is applied to obtain the effective thicknesses of the optical elements knowing their dispersion. The effective thicknesses determined in two cases are compared with those obtained by measuring the equalization wavelengths. A Fourier transform method is applied in processing the spectral interferogram resolved over a wide spectral range in a slightly dispersive Michelson interferometer including a cube beamsplitter. The ambiguous spectral fringe phase is determined and a procedure in removing its ambiguity is applied to obtain the effective thickness of the beamsplitter.

Paper Details

Date Published: 6 December 2006
PDF: 10 pages
Proc. SPIE 5945, 14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics, 59450H (6 December 2006); doi: 10.1117/12.638912
Show Author Affiliations
Petr Hlubina, Silesian Univ. at Opava (Czech Republic)
Igor Gurov, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russia)
Vladimir Chugunov, St. Petersburg State Univ. of Information Technologies, Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 5945:
14th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics
Anton Štrba; Dagmar Senderákova; Miroslav Hrabovský, Editor(s)

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