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Proceedings Paper

Optical quality and laser performance of polycrystal and single crystal Nd:YAG by sintering method
Author(s): A. Ikesue; Yan Lin Aung; T. Yoda; S. Nakayama; T. Kamimura; K. Yoshida
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Paper Abstract

We report the first demonstration of polycrystalline Nd-doped YAG ceramics with almost perfect pore-free structure and Nd-doped YAG single crystal by advanced ceramic processing. The laser conversion efficiency of pore-free polycrystalline Nd:YAG ceramics is extremely high and its optical quality is comparable to that of commercial high quality Nd:YAG single crystal. Moreover, we have succeeded also in fabrication of Nd:YAG single crystal, which enables laser oscillation, by solid-state reaction method. Laser oscillation efficiency was very low when the pores were remained inside single crystal, however the laser oscillation efficiency of pore-free Nd:YAG single crystal was slightly higher than that of polycrystalline Nd:YAG ceramics having grain boundaries. From this fact, it was found that the optical scattering inside the Nd:YAG ceramics occurs mainly at the residual pores and the scattering at the grain boundary is very little. In addition, we confirmed that high concentration Nd:YAG single crystal can be fabricated by sintering method. Applying the above single crystallization technology by sintering method, we have demonstrated the fabrication of layer-by-layer single crystal composite and micron size spherical single crystal.

Paper Details

Date Published: 7 February 2006
PDF: 9 pages
Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599122 (7 February 2006); doi: 10.1117/12.638721
Show Author Affiliations
A. Ikesue, Poly–Techno Co. Ltd. (Japan)
Yan Lin Aung, Poly–Techno Co. Ltd. (Japan)
T. Yoda, Optoquest Co., Ltd. (Japan)
S. Nakayama, Niihama National College of Technology (Japan)
T. Kamimura, Osaka Institute of Technology (Japan)
K. Yoshida, Osaka Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 5991:
Laser-Induced Damage in Optical Materials: 2005
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz, Editor(s)

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