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Proceedings Paper

Structural study of large scale KDP crystals using high energy x-ray diffraction
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Paper Abstract

X-ray diffraction is a non destructive technique used in order to characterize defects in the single crystal. Unfortunately, this analysis can not be performed throughout the whole volume on thick KH2PO4 (KDP) crystals used in the high power lasers systems like NIF and LMJ, these crystals having a thickness close to 10 mm. Considering the usual energy range radiation used for X-ray diffraction and topography (20-30 keV), the beam is rapidly absorbed by the material. However, this problem can be solved by the use of high energy X-ray radiation in order to analyse the complete volume of crystal. The principle of this device will be exposed and preliminary results are shown along with corresponding optical measurements.

Paper Details

Date Published: 7 February 2006
PDF: 7 pages
Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 59911W (7 February 2006); doi: 10.1117/12.638561
Show Author Affiliations
Audrey Surmin, CEA Le Ripault (France)
François Guillet, CEA Le Ripault (France)
Sébastien Lambert, CEA Le Ripault (France)
David Damiani, CEA Le Ripault (France)
Matthieu Pommiès, CEA Le Ripault (France)


Published in SPIE Proceedings Vol. 5991:
Laser-Induced Damage in Optical Materials: 2005
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz, Editor(s)

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