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Proceedings Paper

Determination of the refractive index profile of integrated optical waveguides from near-field measurements
Author(s): M. Halfmann; Lubomir Sumichrast; Walter E. Heinlein
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Paper Abstract

The refractive-index profile of optical waveguides can be obtained from transmitted near-field intensity measurements by the method of transverse offset scanning. As the calculation of the refractive-index profile from the scalar wave equation requires the second derivative of the field distribution, we developed a modified measurement setup, the modulated transverse offset scanning method.

Paper Details

Date Published: 16 December 1992
PDF: 4 pages
Proc. SPIE 1622, Emerging Optoelectronic Technologies, (16 December 1992); doi: 10.1117/12.637018
Show Author Affiliations
M. Halfmann, Univ. of Kaiserslautern (Germany)
Lubomir Sumichrast, Univ. of Kaiserslautern (Germany)
Walter E. Heinlein, Univ. of Kaiserslautern (Germany)

Published in SPIE Proceedings Vol. 1622:
Emerging Optoelectronic Technologies
Krishna Shenai; Ananth Selvarajan; C. Kumar N. Patel; C. N. R. Rao; B. S. Sonde; Vijai K. Tripathi, Editor(s)

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