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Proceedings Paper

Features of recording and calculating XEOL spectra
Author(s): Vyacheslav I. Kochubey; Julia G. Konyukhova; Ol'ga V. Chugunova
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Paper Abstract

Fluorescence techniques of recording EXAFS spectra are considered: XEOL and fluorescence EXAFS. The main causes of spectra distortions induced by both experiment conditions and mechanisms of luminescence's appearance under the action of synchrotron radiation. The algorithms of correction of experimental spectra to compensate for distortions are considered. By the example of alkali-halide crystals, it is demonstrated that, as the spectrum is recorded, radiationinduced transformations of the structure can occur in the sample. These transformations are not brought out in EXAFS spectra, but are detected by the XEOL method.

Paper Details

Date Published: 9 June 2005
PDF: 9 pages
Proc. SPIE 5773, Saratov Fall Meeting 2004: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling V, (9 June 2005); doi: 10.1117/12.636988
Show Author Affiliations
Vyacheslav I. Kochubey, Saratov State Univ. (Russia)
Julia G. Konyukhova, Institute of Mechanics and Physics, Saratov State Univ. (Russia)
Ol'ga V. Chugunova, Saratov State Univ. (Russia)


Published in SPIE Proceedings Vol. 5773:
Saratov Fall Meeting 2004: Laser Physics and Photonics, Spectroscopy, and Molecular Modeling V
Vladimir L. Derbov; Leonid A. Melnikov; Lev M. Babkov, Editor(s)

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