Share Email Print

Proceedings Paper

Measuring electro-optic coefficients of poled polymer films with spatial resolution capability
Author(s): Alin Hou; Hongfei Liu; Jie Sun; Daming Zhang; Maobin Yi
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A method for measuring the electro-optic coefficient of poled polymer films on the basis of an asymmetry Fabry-Perot cavity is described. Two aluminum films were deposited on glass substrate by thermal evaporation in high vacuum to form high reflection mirror and low reflection mirror, respectively. Nonlinear polymer thin films are spin coated on low reflection mirror and poled by corona poling in order to break the internal centrosymmetry. Then the sample layers are placed upside down on the high reflection mirror. The sandwich structure is objected to a laser beam, and a variable voltage is applied the aluminium films resulting in a modulation of the transmitted laser power. The electro-optic coefficient γ13 of the poled polymer film can be calculated by evaluating the Fabry-Perot equation. The spatial resolution is tested with a polymer film that was poled by a needle corona discharge in air through a metal grating with a period of 120 microns. By scanning the sample plate in the direction perpendicular to the grating lines, the spatial resolution is also demonstrated according to the spacing of the poled structure.

Paper Details

Date Published: 1 December 2005
PDF: 8 pages
Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 602008 (1 December 2005); doi: 10.1117/12.636496
Show Author Affiliations
Alin Hou, Jilin Univ. (China)
Changchun University of Technology (China)
Hongfei Liu, Jilin Univ. (China)
Jie Sun, Jilin Univ. (China)
Daming Zhang, Jilin Univ. (China)
Maobin Yi, Jilin Univ. (China)

Published in SPIE Proceedings Vol. 6020:
Optoelectronic Materials and Devices for Optical Communications
Shinji Tsuji; Jens Buus; Yi Luo, Editor(s)

© SPIE. Terms of Use
Back to Top