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Proceedings Paper

High resolution surface plasmon interference resonance phase imaging
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Paper Abstract

A Surface Plasmon Resonance(SPR) sensor based on Kretschmann configuration has been setup. In this setup, Ag was applied as supporting metal, and incident angle was fixed. There are two main method, one is Surface Plasmon Microscopy(SPM) based on optical intensity, the other the Surface Plasmon Interference Microscopy (SPIM) based on the theory of Surface Plasmon Resonance and optical interference. SPM and SPIM were analyzed both theoretically and experimentally. Comparing and analyzing the result of theory and experiment, the result shows that SPIM has higher spatial resolution than SPM, and more powerful and immune to noise due to ambient light. So the SPIM is more fitful for sensor applications than SPM.

Paper Details

Date Published: 6 December 2005
PDF: 8 pages
Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 60203F (6 December 2005); doi: 10.1117/12.635974
Show Author Affiliations
Qiang Lv, Huazhong Univ. of Science and Technology (China)
Xiuhua Yuan, Huazhong Univ. of Science and Technology (China)
Dexiu Huang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6020:
Optoelectronic Materials and Devices for Optical Communications
Shinji Tsuji; Jens Buus; Yi Luo, Editor(s)

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