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Proceedings Paper

The reliability of tunnel junction regenerated light emitting diodes
Author(s): Xiaoming Wang; Weiling Guo; Yongtao Tian; Xia Guo; Guo Gao; Guangdi Shen
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Paper Abstract

The theory of Light Emitting Diodes(LEDs) life tests and mathematic model of life tests were introduced. The performance of LEDs was affected by the drive current and by the ambient temperature. Life tests of tunnel junction regenerated AlGaInP LEDs were performed at different currents and ambient temperatures. On axis output intensity of tunnel junction regenerated LED had decreased 35.53% after 5203 hours at 30mA and 25°C. At the ambient temperature of 80°C, on axis output intensity of tunnel junction regenerated LED had degraded 19.26% after 3888 hours at 20mA. According to the results mentioned above, the normal working lifetime of tunnel junction regenerated LEDs were concluded. Moreover, the main Failure Mechanisms of it were described. Our work reviews the failure analysis that was performed on the degraded LEDs and the degradation mechanisms that were identified. The results show a thermal degradation mechanism that dominates degradation at high ambient temperatures.

Paper Details

Date Published: 5 December 2005
PDF: 10 pages
Proc. SPIE 6020, Optoelectronic Materials and Devices for Optical Communications, 60201X (5 December 2005); doi: 10.1117/12.635049
Show Author Affiliations
Xiaoming Wang, Beijing Univ. of Technology (China)
Beijing Optoelectronic Technology Lab. (China)
Weiling Guo, Beijing Univ. of Technology (China)
Beijing Optoelectronic Technology Lab. (China)
Yongtao Tian, Beijing Univ. of Technology (China)
Beijing Optoelectronic Technology Lab. (China)
Xia Guo, Beijing Univ. of Technology (China)
Beijing Optoelectronic Technology Lab. (China)
Guo Gao, Beijing Univ. of Technology (China)
Beijing Optoelectronic Technology Lab. (China)
Guangdi Shen, Beijing Univ. of Technology (China)
Beijing Optoelectronic Technology Lab. (China)


Published in SPIE Proceedings Vol. 6020:
Optoelectronic Materials and Devices for Optical Communications
Shinji Tsuji; Jens Buus; Yi Luo, Editor(s)

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