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Proceedings Paper

Resilience in all-optical label switching networks: a node dimensioning point of view
Author(s): Ruth Van Caenegem; Didier Colle; Mario Pickavet; Piet Demeester
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Paper Abstract

This paper deals with resilience in all-optical networks. The main disadvantage when designing all-optical label swapping networks is the enormous dimensions an all-optical node can have. The node's size relates directly to the number of Label Switched Paths passing through the node. In this paper, we discuss how the dimensions of the all-optical node alter when introducing resilience in label swapping and stripping networks. We compare the node dimensions for different recovery strategies and different all-optical networking approaches.

Paper Details

Date Published: 6 December 2005
PDF: 12 pages
Proc. SPIE 6022, Network Architectures, Management, and Applications III, 602228 (6 December 2005); doi: 10.1117/12.634757
Show Author Affiliations
Ruth Van Caenegem, Ghent Univ. (Belgium)
Didier Colle, Ghent Univ. (Belgium)
Mario Pickavet, Ghent Univ. (Belgium)
Piet Demeester, Ghent Univ. (Belgium)


Published in SPIE Proceedings Vol. 6022:
Network Architectures, Management, and Applications III
Kwok-wai Cheung; Gee-Kung Chang; Guangcheng Li; Ken-Ichi Sato, Editor(s)

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