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Proceedings Paper

Iron-silicon interface formation and properties by data of DRS, SMOKE, and AFM measurements
Author(s): S. A. Dotsenko; N. G. Galkin; A. S. Gouralnik; L. A. Koval; T. V. Turchin
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Paper Abstract

The method of Differential Reflection Spectroscopy (DRS) have been applied to study thin iron films during the process of growth on Si (111) or Si(100) surfaces at room temperature. Some details on the Dynamic Standard method in DRS method are presented. Magnetic properties of as-grown films have been demonstrated by the SMOKE method. Dependence ofdielectric functions of the films on the deposit amount is given.

Paper Details

Date Published: 8 June 2005
PDF: 7 pages
Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); doi: 10.1117/12.634545
Show Author Affiliations
S. A. Dotsenko, Institute for Automation and Control Processes (Russia)
N. G. Galkin, Institute for Automation and Control Processes (Russia)
A. S. Gouralnik, Institute for Automation and Control Processes (Russia)
L. A. Koval, Far Eastern State Univ. (Russia)
T. V. Turchin, Far Eastern State Univ. (Russia)


Published in SPIE Proceedings Vol. 5851:
Fundamental Problems of Optoelectronics and Microelectronics II
Yuri N. Kulchin; Oleg B. Vitrik; Vladimir I. Stroganov, Editor(s)

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