Share Email Print
cover

Proceedings Paper

Laser conditioning of high-reflective and anti-reflective coatings at 1064 nm
Author(s): Yuanan Zhao; Jianda Shao; Hongbo He; Zhengxiu Fan
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Laser conditioning effects of the HfO2/SiO2 High-reflective (HR) and Anti-reflective (AR) coatings at 1064 nm and the accumulation effects of multi-shot laser radiation were investigated. The HfO2/SiO2 HR and AR coatings were prepared by E-beam evaporation (EBE). The single-shot and multi-shot laser induced damage threshold was detected following ISO standard 11254-1.2, and the laser conditioning was conducted by three-step raster scanning method. It was found that laser damage resistance of the HR coatings for both single-shot and multi-shot laser radiation was enhanced after laser conditioning, and the single-shot laser induced damage threshold (LIDT) got the greatest enhancement. There was obvious shot to shot laser damage accumulations for HR samples and the LIDT decreased as the shot number increased. Laser conditioning can also improve the multi-shot laser damage accumulations behaviors of the HR samples. However, the AR coatings had no laser conditioning enhancement and multi-shot laser damage accumulation effects. A Nomarski microscope was employed to map the damage morphology, and it found that the damage behavior was defect-initiated for both samples.

Paper Details

Date Published: 7 February 2006
PDF: 6 pages
Proc. SPIE 5991, Laser-Induced Damage in Optical Materials: 2005, 599117 (7 February 2006); doi: 10.1117/12.634130
Show Author Affiliations
Yuanan Zhao, Shanghai Institute of Optics and Fine Mechanics (China)
Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)
Hongbo He, Shanghai Institute of Optics and Fine Mechanics (China)
Zhengxiu Fan, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 5991:
Laser-Induced Damage in Optical Materials: 2005
Gregory J. Exarhos; Arthur H. Guenther; Keith L. Lewis; Detlev Ristau; M.J. Soileau; Christopher J. Stolz, Editor(s)

© SPIE. Terms of Use
Back to Top