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Proceedings Paper

Depth position detection of the particles in digital holographic particle image velocimetry (DHPIV)
Author(s): V. Ilchenko; T. Lex; T. Sattelmayer
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Paper Abstract

Due to the fast improvement of digital sensors the digital holographic particle image velocimetry (DHPIV) becomes a promising measurement technique for the determination of the three dimensional velocity components for standard flow problems. Basically, this technique is based upon correlation and particle tracking methods for the extraction of the velocity information from teh images. If a high-speed digital camera is used, the velocity information from the tracer particles is saved in discrete time steps in form of holograms. Each hologram implicitly contains the information about the 3D volume and accordingbly the location of the tracer particles. Their 3D coordinates can be obtained after numerical reconstruction of the investigated volume from the corresponding hologram. Applying correlation and/or particle tracking methods to the holographic films yield the velocity components of the flow passing through the investigated volume. At present, on of the major problems is the accuracy of the particles depth coordinates determination, which is due to the still relative small resolution of the sensors. This paper aims to analyse the efficiency of existing particles depth coordinates extraction techniques, as well as their combination with known techniques of hologram pre-processing like the zero-order elimination in the in-line setup. Additionally, a novel technique for the extraction of the depth positions of the particles is presented, which improves the accuracy of the particles depth coordinate extraction.

Paper Details

Date Published: 8 June 2005
PDF: 6 pages
Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); doi: 10.1117/12.634069
Show Author Affiliations
V. Ilchenko, Technical Univ. of Munich (Germany)
T. Lex, Technical Univ. of Munich (Germany)
T. Sattelmayer, Technical Univ. of Munich (Germany)


Published in SPIE Proceedings Vol. 5851:
Fundamental Problems of Optoelectronics and Microelectronics II
Yuri N. Kulchin; Oleg B. Vitrik; Vladimir I. Stroganov, Editor(s)

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